Welcome to ATEEDA

The ultimate EDA tools for analog tests

• Cuts analog test costs by 90%
• Production proven on 1,000,000 parts
• Slashes test time for analog sections
• Pushbutton Built-In Self-Test (BIST)
• Parallel analog testing by digital ATE, even at wafer probe
• Suits ADCs & DACs thru to regulators & references
• Faster, simpler AMS Test Program Development

ATEEDA’s family of EDA tools provides dramatic reductions in the cost of analog test. Our philosophy is simple but extremely powerful, just like our tests: Exploit intelligence, not brute force. Our tools employ very smart algorithms to create very simple tests that only require the tiny and robust analog IP we provide.

Contact Us

ATEEDA Test Development and BIST Tools

Email:

Tel: +44 (0)131 272 2754

LinBIST

Pushbutton built in self test for linear circuits

LinBIST’s powerful GUI empowers you to create efficient digital BIST designs for analog functions without having to write a single line of Verilog. For ADCs and DACs, simply enter the convertor specifications that the test must check, select the interface options for integrating the result with your own design and output the solution.

OptimATE

Delivering Digital testing of Analog circuits

OptimATE uses powerful patented algorithms offline at test development time, to find the perfect digital stimulus for your analog circuit. From more than a billion, billion candidates, OptimATE makes a beeline for one which highlights your circuit’s faults.

• ATEEDA among ‘hottest new technology companies’ in EE Times Silicon 60 V9.0 (05-Oct-2009)

  For the third time in a row, ATEEDA retains its position in the voice-of-the-industry EE Times 'Silicon 60'.
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• ATEEDA announces the successful implementation of a revolutionary time-efficient test method for e2v’s ASICs (18-Jun-2009)

  ATEEDA, a world leader in semiconductor test tools and solutions, has developed a new test regime for e2v’s sophisticated mixed signal automotive ASICs with ATEEDA’s OptimATE tool. Following careful evaluation, extensive trials have confirmed that OptimATE can deliver a new level of analog test performance to e2v’s ASIC products; reducing overall test times whilst increasing the range and complexity of possible tests.
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