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Welcome to ATEEDA

The ultimate EDA tools for analog tests

  • Cuts analog test costs by 90%
  • Slashes test time for analog sections
  • Accelerates and simplifies mixed signal circuit Test Program Development
  • Parallel analog testing digital ATE, even at wafer probe
  • Enables Built In Self Test - BIST
  • Minimal on-chip changes for new designs or to load board for existing designs
  • Suited to ADCs and DACs thru to regulators

ATEEDA’s family of EDA tools provides dramatic reductions in the cost of analog test. Our philosophy is simple but extremely powerful, just like our tests: Exploit intelligence, not brute force. Our tools employ very smart algorithms to create very simple tests.

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ATEEDA Test Development and BIST Tools

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Tel: +44 (0)131 272 2754

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LinBIST

Pushbutton built in self test for linear circuits

LinBIST’s powerful GUI empowers you to create efficient digital BIST designs for analog functions without having to write a single line of Verilog. For ADCs and DACs, simply enter the convertor specifications that the test must check, select the interface options for integrating the result with your own design and output the solution.

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OptimATE

Delivering Digital testing of Analog circuits

OptimATE uses powerful patented algorithms offline at test development time, to find the perfect digital stimulus for your analog circuit. From more than a billion, billion candidates, OptimATE makes a beeline for one which highlights your circuit’s faults..

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