- Cuts analog test costs by 90%
- Production proven on 1,000,000 parts
- Slashes test time for analog sections
- Pushbutton Built-In Self-Test (BIST)
- Parallel analog testing by digital ATE, even at wafer probe
- Suits ADCs & DACs thru to regulators & references
- Faster, simpler AMS Test Program Development
Welcome to ATEEDA
The ultimate EDA tools for analog tests
ATEEDA’s family of EDA tools provides dramatic reductions in the cost of analog test. Our philosophy is simple but extremely powerful, just like our tests: Exploit intelligence, not brute force. Our tools employ very smart algorithms to create very simple tests that only require the tiny and robust analog IP we provide.
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Contact Us
ATEEDA Test Development and BIST Tools
Email:
Tel: +44 (0)131 272 2754
LinBIST
Pushbutton built in self test for linear circuits
LinBIST’s powerful GUI empowers you to create efficient digital BIST designs for analog functions without having to write a single line of Verilog. For ADCs and DACs, simply enter the convertor specifications that the test must check, select the interface options for integrating the result with your own design and output the solution.
OptimATE
Delivering Digital testing of Analog circuits
OptimATE uses powerful patented algorithms offline at test development time, to find the perfect digital stimulus for your analog circuit. From more than a billion, billion candidates, OptimATE makes a beeline for one which highlights your circuit’s faults.
Latest News
ATEEDA secures further £500,000 investment from AIIL and SCIF (30-Jun-2010)
To coincide with the successful launch of a brand new tool for cutting the cost of testing microchips, ATEEDA and Archangel Informal Investments are delighted to announce that they have concluded a new funding round.- Read item
ATEEDA announces participation in DAC 2010, Anaheim, 14th-16th June (27-May-2010)
ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at DAC 2010 (the Design Automation Conference).- Read item