<?xml version="1.0" encoding="ISO-8859-1"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/"
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	xmlns="http://purl.org/rss/1.0/"><channel rdf:about="http://www.ateeda.com/"><title>Latest News</title><description>Showing the 10 most recent press releases for Ateeda Ltd</description><link>http://www.ateeda.com/</link><items><rdf:Seq><rdf:li rdf:resource="http://www.ateeda.com/news/20/" /><rdf:li rdf:resource="http://www.ateeda.com/news/19/" /><rdf:li rdf:resource="http://www.ateeda.com/news/18/" /><rdf:li rdf:resource="http://www.ateeda.com/news/17/" /><rdf:li rdf:resource="http://www.ateeda.com/news/16/" /><rdf:li rdf:resource="http://www.ateeda.com/news/14/" /><rdf:li rdf:resource="http://www.ateeda.com/news/13/" /><rdf:li rdf:resource="http://www.ateeda.com/news/3/news-ateeda-worlds-first-push-button-analog-bist-tool" /><rdf:li rdf:resource="http://www.ateeda.com/news/2/news-ateeda-silicon-60" /><rdf:li rdf:resource="http://www.ateeda.com/news/4/ateeda-john-logie-baird-award" /></rdf:Seq></items></channel><item rdf:about="http://www.ateeda.com/news/20/"><link>http://www.ateeda.com/news/20/</link><title>ATEEDA secures further &amp;pound;500,000 investment from AIIL and SCIF</title><description>To coincide with the successful launch of a brand new tool for cutting the cost of testing microchips, ATEEDA and Archangel Informal Investments are delighted to announce that they have concluded a new funding round.</description><dc:date>2010-06-30T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/19/"><link>http://www.ateeda.com/news/19/</link><title>ATEEDA announces participation in DAC 2010, Anaheim, 14th-16th June</title><description>ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at DAC 2010 (the Design Automation Conference).</description><dc:date>2010-05-27T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/18/"><link>http://www.ateeda.com/news/18/</link><title>Industry leaders discuss the semiconductor sector recovery</title><description>ATEEDA&amp;rsquo;s CEO David Hamilton moderated a lively panel debate at the Synopsys Executive Forum with Aart de Geus, Hossein Yassaie and Doug Pulley.</description><dc:date>2010-05-04T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/17/"><link>http://www.ateeda.com/news/17/</link><title>ATEEDA CEO David Hamilton joins top industry panel at VLSI Test Symposium 2010</title><description>ATEEDA Chief Executive David Hamilton will be joining a panel of senior figures from the EDA and Semiconductor industries at the VLSI Test Symposium in April.</description><dc:date>2010-03-24T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/16/"><link>http://www.ateeda.com/news/16/</link><title>ATEEDA announces participation in DATE 2010, Dresden, 8-12th March</title><description>ATEEDA announces it will be demonstrating a new version of LinBIST  with support for testing 16-bit ADCs at the Design, Automation &amp;amp; Test in Europe (DATE) conference.</description><dc:date>2010-02-24T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/14/"><link>http://www.ateeda.com/news/14/</link><title>ATEEDA among &amp;lsquo;hottest new technology companies&amp;rsquo; in EE Times Silicon 60 V9.0</title><description>For the third time in a row, ATEEDA retains its position in the voice-of-the-industry EE Times &amp;#039;Silicon 60&amp;#039;.</description><dc:date>2009-10-05T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/13/"><link>http://www.ateeda.com/news/13/</link><title>ATEEDA announces the successful implementation of a revolutionary time-efficient test method for e2v&amp;rsquo;s ASICs</title><description>ATEEDA, a world leader in semiconductor test tools and solutions, has developed a new test regime for e2v&amp;rsquo;s sophisticated mixed signal automotive ASICs with ATEEDA&amp;rsquo;s OptimATE tool.  
	
Following careful evaluation, extensive trials have confirmed that OptimATE can deliver a new level of analog test performance to e2v&amp;rsquo;s ASIC products; reducing overall test times whilst increasing the range and complexity of possible tests.</description><dc:date>2009-06-18T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/3/news-ateeda-worlds-first-push-button-analog-bist-tool"><link>http://www.ateeda.com/news/3/news-ateeda-worlds-first-push-button-analog-bist-tool</link><title>ATEEDA announces world&amp;rsquo;s first Push Button ANALOG BIST tool at DAC 2009</title><description>Revolutionary EDA product for the semiconductor design and manufacturing industry is to be launched at premier global exhibition event in San Francisco in July 2009.</description><dc:date>2009-03-20T00:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/2/news-ateeda-silicon-60"><link>http://www.ateeda.com/news/2/news-ateeda-silicon-60</link><title>ATEEDA two years in a row in EE Times Silicon 60</title><description>In a year of stiff competition from the world&amp;#039;s best emerging young semiconductor companies, ATEEDA retains its position on the voice-of-the-industry, EE Times &amp;#039;Silicon 60&amp;#039;.</description><dc:date>2009-02-05T01:00:00+02:00</dc:date></item>

<item rdf:about="http://www.ateeda.com/news/4/ateeda-john-logie-baird-award"><link>http://www.ateeda.com/news/4/ateeda-john-logie-baird-award</link><title>ATEEDA wins coveted John Logie Baird Award</title><description>David Hamilton, ATEEDA&amp;#039;s CEO, collects John Logie Baird Awards Knowledge Transfer Champion trophy after keynote speech from television-inventor&amp;#039;s son Malcolm Baird.</description><dc:date>2008-12-12T01:00:00+02:00</dc:date></item>

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