Cadence’s CDNLive event in Munich provided a receptive audience for the opportunities offered by LinBIST in analog BIST.
ATEEDA’s LinBIST recently received additional validation by STMicroelectronics as a BIST alternative to high capital cost conventional analog test equipment.
ATEEDA joins the Cadence Connections program (13-May-2011)
ATEEDA, a world leader in semiconductor test solutions, is delighted to have joined the Cadence Connections program.
ATEEDA announces it will be demonstrating LinBIST for convertors at DAC 2011 (the Design Automation Conference).
Edinburgh and London, 28 September 2010 - ATEEDA announces the appointment to its board of a leading semiconductor industry figure, Malcolm Penn.
To coincide with the successful launch of a brand new tool for cutting the cost of testing microchips, ATEEDA and Archangel Informal Investments are delighted to announce that they have concluded a new funding round.
ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at DAC 2010 (the Design Automation Conference).
ATEEDA’s CEO David Hamilton moderated a lively panel debate at the Synopsys Executive Forum with Aart de Geus, Hossein Yassaie and Doug Pulley.
ATEEDA Chief Executive David Hamilton will be joining a panel of senior figures from the EDA and Semiconductor industries at the VLSI Test Symposium in April.
ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at the Design, Automation & Test in Europe (DATE) conference.