News

Analog BIST paper well received at Cadence CDNLive Munich (18-May-2012)

Cadence’s CDNLive event in Munich provided a receptive audience for the opportunities offered by LinBIST in analog BIST.

ATEEDA’s LinBIST receives additional validation by STMicroelectronics (05-Jul-2011)

ATEEDA’s LinBIST recently received additional validation by STMicroelectronics as a BIST alternative to high capital cost conventional analog test equipment.

ATEEDA joins the Cadence Connections program (13-May-2011)

ATEEDA, a world leader in semiconductor test solutions, is delighted to have joined the Cadence Connections program.

ATEEDA announces participation in DAC 2011, San Diego, 5-10th June (29-Mar-2011)

ATEEDA announces it will be demonstrating LinBIST for convertors at DAC 2011 (the Design Automation Conference).

Adding Malcolm Penn of Future Horizons enhances ATEEDA’s board (28-Sep-2010)

Edinburgh and London, 28 September 2010 - ATEEDA announces the appointment to its board of a leading semiconductor industry figure, Malcolm Penn.

ATEEDA secures further £500,000 investment from AIIL and SCIF (30-Jun-2010)

To coincide with the successful launch of a brand new tool for cutting the cost of testing microchips, ATEEDA and Archangel Informal Investments are delighted to announce that they have concluded a new funding round.

ATEEDA announces participation in DAC 2010, Anaheim, 14th-16th June (27-May-2010)

ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at DAC 2010 (the Design Automation Conference).

Industry leaders discuss the semiconductor sector recovery (04-May-2010)

ATEEDA’s CEO David Hamilton moderated a lively panel debate at the Synopsys Executive Forum with Aart de Geus, Hossein Yassaie and Doug Pulley.

ATEEDA CEO David Hamilton joins top industry panel at VLSI Test Symposium 2010 (24-Mar-2010)

ATEEDA Chief Executive David Hamilton will be joining a panel of senior figures from the EDA and Semiconductor industries at the VLSI Test Symposium in April.

ATEEDA announces participation in DATE 2010, Dresden, 8-12th March (24-Feb-2010)

ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at the Design, Automation & Test in Europe (DATE) conference.