ATEEDA announces participation in DATE 2010, Dresden, 8-12th March
24-Feb-2010
ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at the Design, Automation & Test in Europe (DATE) conference.
LinBIST is the world’s first EDA tool giving truly pushbutton built-in-self-test, and was launched at the Design Automation Conference (DAC) in July 2009. ATEEDA is now announcing an enhanced version of LinBIST with support for testing 16-bit ADCs, which will be demonstrated at DATE in Dresden from 8-12th March 2010.
ATEEDA’s CEO, David Hamilton commented “LinBIST takes the effort out of analog BIST and keeps the overhead on-chip to a tiny fraction of alternative methods. Extending its capability to 16-bit ADCs significantly increases the number of designs that can benefit from the substantial cost savings it delivers”.
ATEEDA invites visitors to DATE booth 3 in the main exhibition hall.
