ATEEDA announces participation in DAC 2010, Anaheim, 14th-16th June
ATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at DAC 2010 (the Design Automation Conference).
LinBIST is the world’s first EDA tool giving truly pushbutton built-in-self-test, and was launched at DAC in July 2009. ATEEDA is now announcing an enhanced version of LinBIST, with support for testing 16-bit ADCs, which will be demonstrated at DAC in Anaheim, California from 14-16th June 2010.
ATEEDA’s CEO, David Hamilton, commented “LinBIST takes the effort out of analog BIST and keeps the overhead on-chip to a tiny area. Extending its capability to 16-bit ADCs significantly increases the number of designs that can benefit from the substantial cost savings it delivers”.
ATEEDA invites visitors to DAC booth 1016 in the main exhibition hall.