ATEEDA’s LinBIST receives additional validation by STMicroelectronics

05-Jul-2011

ATEEDA’s LinBIST recently received additional validation by STMicroelectronics as a BIST alternative to high capital cost conventional analog test equipment. A 50MHz, 12-bit ADC in 55nm CMOS process was fabricated incorporating LinBIST’s test structures. The results were found to match or exceed the performance of the conventional test approach, and full characterisation was also achieved using only digital connections to the device.

For further details please see the Analog BIST for ADCs case study and Electronics Weekly's article.