ATEEDA announces world’s first Push Button ANALOG BIST tool at DAC 2009
20-Mar-2009
ATEEDA announces world’s first Push Button ANALOG BIST tool at DAC 2009
Revolutionary EDA product for the semiconductor design and manufacturing industry is to be launched at premier global exhibition event in San Francisco in July 2009.
Building on the success in volume production testing of its core EDA analog test tool, OptimATE, ATEEDA announces a revolution in analog BIST. LinBIST is the world’s first EDA tool giving truly pushbutton built-in-self-test. Now the cost-savings associated with BIST are open to all semiconductor companies including IDMs and Fabless alike.
Covering a wide range of analog circuits from ADCs and DACs to regulators and line drivers, ATEEDA’s family of tools use smart algorithms and restricted digital circuitry, with minimal analog additions, to bring the benefits of BIST. LinBIST generates the HDL automatically so no code needs to be handwritten.
ATEEDA’s CEO, David Hamilton commented “LinBIST takes the effort out of analog BIST and keeps the overhead on-chip to a tiny fraction of alternative methods. Both key pre-requisites for BIST to unlock the savings in slashing test time and capital equipment cost’.
The new tools will be launched during the world’s premier exhibition and conference event for the semiconductor design industry, DAC in San Francisco, July 2009. ATEEDA invites visitors to DAC booth 4102 in the IC Design Chain pavilion.
