ATEEDA joins EE Times Silicon 60 Emerging Startups
14-Feb-2008
15 new entrants to global list of most significant new semiconductor companies.
ATEEDA is one of only 15 new entrants to be recognised by the voice of the industry, the EE Times, for inclusion on its 'Silicon 60'. This elite global list of companies, which highlights the best emerging companies in the field of semiconductors, can be viewed in full at EE Times.
Peter Clarke, the European Editor of the EE Times said, "The startups on the Silicon 60 list are companies involved in semiconductor chips, memory, MEMS, EDA software, embedded applications, foundry manufacturing, semiconductor production equipment, electronics subsystems, packaging and materials that have made an impression on EE Times editors. They are emerging companies to watch - for a wide variety of reasons. The companies in version 7.0 of the EE Times Emerging Startups list have been selected by editors based on a mix of criteria including: technology, intended market, maturity, financial position and management and investment profile. At this iteration 15 companies have been brought on to the list."
ATEEDA's CEO, David Hamilton noted, "It is particularly pleasing to have ATEEDA's significance recognised within a Californian-Corporations dominated list. It demonstrates how major new technologies like ours can emerge to serve a global market."
ATEEDA, founded in 2006, specializes in testing mixed signal devices which have both analog and digital sections. The company has developed the world's first effective software electronic design automation (EDA) tool, OptimATE, that allows analog sections to be tested on digital testers, enabling manufacturers to save substantial amounts of time and money.
OptimATE is ATEEDA's core product, offering a unique combination of features and benefits, particularly for mixed signal semiconductor manufacturers. Benefits include dramatically reduced production test time, reduced and test cost, simplified analog test equipment requirements, and improved statistical information about test coverage assisting with reliability.