Overview
The ultimate EDA tools for analog test of: ADCs & DACs, Regulators, References, Drivers
ATEEDA’s family of EDA tools provides dramatic reductions in the cost of analog test. Our philosophy is simple but extremely powerful, just like our tests: Exploit intelligence, not brute force.
- Our tools employ very smart algorithms to create very simple tests.
- Cuts analog test costs by up to 90%
- Slashes test time for analog sections
- Parallel analog testing using Digital ATE, even at wafer probe
- Enables Built In Self Test - BIST
- Accelerates and simplifies Mixed Signal Circuit Test Program Development
- Minimal on-chip changes for new designs, or to load board for existing designs
Achieve solutions perfectly matched to each design by simulation. Resolve your analog test headaches smoothly offline. Create almost totally digital solutions to enhance even basic digital testers. The tests we implement are so simple that we offer a push-button solution, LinBIST, so you can embed them in your design as HDL code, ready for synthesis, layout and verification.
Push-button BIST for analog circuity, implemented automatically in a strictly limited number of digital gates, without having to write a line of code. That cuts more than test costs, it cuts development time too because once your chip is verified, so is your test. We have refined the test development to fit your own established design and test flow. Choose whether you need BIST or just want to enhance your digital ATE.
LinBIST covers BIST for ADCs and DACs up to 16 bits with our automated generation giving fully programmable BIST capability.
So whether it’s convertors, regulators or references, drivers or filters, our tools solve your analog test problems with the minimum of overhead.
Choose ATEEDA to solve your analog test headaches and substantially reduce your test time and cost.
