Product Overview
The ultimate EDA Tools and IP for analog test of ADCs & DACs and more
ATEEDA’s LinBIST suite of EDA tools and silicon-proven IP provide dramatic reductions in the cost of analog test, and alleviate the test access problems in highly integrated devices.
Our philosophy is simple but extremely powerful, just like our tests: Exploit intelligence, not brute force. Our tools enable analog Built In Self Test (BIST) using very smart algorithms to create very simple tests.
Benefits of LinBIST:
- dramatic reductions in costs
- reduces pins needed for test in SoC and SiP (System-in-Package)
- slashes test time for analog sections
- tests analog blocks on digital testers
- allows parallel testing, even at wafer probe
- automates test program development
- offers in-life testing
Simple Configuration
Use the LinBIST GUI to configure our IP to perfectly match your requirements.
Simply enter the convertor specifications that the test must check, select the interface options for integrating the result with your own design and output the solution.
With a single click, LinBIST generates a mixed signal IP block ready to embed in your design. The LinBIST IP consists of a tiny analog circuit and synthesisable HDL for a strictly limited number of digital gates. The test is implemented automatically without the designer writing a single line of code.
The process has been refined to fit your own established design, verification and test flow.
No Test Development
LinBIST does more than cut test costs, it cuts development time too because once your chip is verified, so is your test.
Characterisation
ATEEDA supply automated characterisation software which communicates with the circuits on chip and uses multiple test passes to quickly and accurately establish the detailed characteristics of individual devices on the lab bench.
LinBIST characterisation tool showing DNL and INL plots for an ADC
Choose ATEEDA to solve your analog test headaches and substantially reduce your test time and cost.