LinBIST for ADCs
LinBIST provides dramatic reductions in the cost of ADC testing, and alleviates test access problems in highly integrated devices.
LinBIST for ADCs is proven in silicon from 0.18um to 55nm, has exemplary mixed signal verification at all levels, and is suitable for ADCs of any architecture and with up to 16 bits resolution.
Using LinBIST for ADCs
Simply use the GUI to enter the convertor specifications that the test must check, select the interface options for integrating the result with your own design and output the customised IP block.
The solution consists of a tiny analogue circuit and minimal HDL for synthesis with the rest of the design. LinBIST is designed to integrate with your existing tool flow, and the output can be treated in the same way as any other IP block.
Features
- Compatible with all major tool flows
- Various standard interface options available
- Test-benches and models available to support verification
- Automatic silicon characterisation available