OptimATE
Delivering Digital testing of Analog circuits
- Optimized digital tests for analog functions
- Orders of magnitude faster tests and lower costs
- Proven in production to enhance digital testers
- Convenient user interface
- Suits your design and test flow
OptimATE uses patented algorithms offline at test development time to find the perfect digital stimulus for your analog circuit. From a billion, billion candidates, OptimATE makes a beeline for one which highlights your circuit’s faults. So your digital tester’s comparator can catch them at waferprobe (EWS) or final test.
Or better still, also use LinBIST to put the test on-chip automatically, with the rest of your digital section.
