Latest NewsShowing the 10 most recent press releases for Ateeda Ltdhttp://www.ateeda.com/http://www.ateeda.com/news/25/Analog BIST paper well received at Cadence CDNLive MunichCadence’s CDNLive event in Munich provided a receptive audience for the opportunities offered by LinBIST in analog BIST.2012-05-18T00:00:00+02:00http://www.ateeda.com/news/24/ATEEDA’s LinBIST receives additional validation by STMicroelectronicsATEEDA’s LinBIST recently received additional validation by STMicroelectronics as a BIST alternative to high capital cost conventional analog test equipment.2011-07-05T00:00:00+02:00http://www.ateeda.com/news/23/ATEEDA joins the Cadence Connections programATEEDA, a world leader in semiconductor test solutions, is delighted to have joined the Cadence Connections program.2011-05-13T00:00:00+02:00http://www.ateeda.com/news/22/ATEEDA announces participation in DAC 2011, San Diego, 5-10th JuneATEEDA announces it will be demonstrating LinBIST for convertors at DAC 2011 (the Design Automation Conference).2011-03-29T00:00:00+02:00http://www.ateeda.com/news/21/Adding Malcolm Penn of Future Horizons enhances ATEEDA’s boardEdinburgh and London, 28 September 2010 - ATEEDA announces the appointment to its board of a leading semiconductor industry figure, Malcolm Penn.2010-09-28T00:00:00+02:00http://www.ateeda.com/news/20/ATEEDA secures further £500,000 investment from AIIL and SCIFTo coincide with the successful launch of a brand new tool for cutting the cost of testing microchips, ATEEDA and Archangel Informal Investments are delighted to announce that they have concluded a new funding round.2010-06-30T00:00:00+02:00http://www.ateeda.com/news/19/ATEEDA announces participation in DAC 2010, Anaheim, 14th-16th JuneATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at DAC 2010 (the Design Automation Conference).2010-05-27T00:00:00+02:00http://www.ateeda.com/news/18/Industry leaders discuss the semiconductor sector recoveryATEEDA’s CEO David Hamilton moderated a lively panel debate at the Synopsys Executive Forum with Aart de Geus, Hossein Yassaie and Doug Pulley.2010-05-04T00:00:00+02:00http://www.ateeda.com/news/17/ATEEDA CEO David Hamilton joins top industry panel at VLSI Test Symposium 2010ATEEDA Chief Executive David Hamilton will be joining a panel of senior figures from the EDA and Semiconductor industries at the VLSI Test Symposium in April.2010-03-24T00:00:00+02:00http://www.ateeda.com/news/16/ATEEDA announces participation in DATE 2010, Dresden, 8-12th MarchATEEDA announces it will be demonstrating a new version of LinBIST with support for testing 16-bit ADCs at the Design, Automation & Test in Europe (DATE) conference.2010-02-24T00:00:00+02:00